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Testing experiences with z/OS V2R1 CF LOSSCONN Recovery Management (also known as Serial Rebuild)



Document Author:
Additional Author(s):

Neil Johnson
Kieron D Hinds, Zhao Yu Wang


Document ID:

WP102520


Doc. Organization:

IBM Systems


Document Revised:

04/02/2015


Product(s) covered:

z/OS







Abstract: This paper documents our experiences with testing the z/OS V2R1 CF LOSSCONN Recovery Management (CFLCRMGMT) function. We will show how this enhancement improves structure recovery processing when a loss of connectivity to a coupling facility (CF) occurs. Our experiences result from testing CF failures in the IBM Large Configuration System Test for Enterprise (LCST/e) environment which represents one of the most customer-like test environments within IBM.

serbld.pdfserbld.pdf



Classification:

Software

Category:

Planning and Design




Platform(s):

IBM System z Family

S/W Pillar(s):

IBM System z Software

O/S:

z/OS

Keywords:

z/OS XCF CFRM CFLCRMGMT RECPRTY

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