Testing experiences with z/OS V2R1 CF LOSSCONN Recovery Management (also known as Serial Rebuild)
Document Author: Additional Author(s):
Kieron D Hinds, Zhao Yu Wang
Abstract: This paper documents our experiences with testing the z/OS V2R1 CF LOSSCONN Recovery Management (CFLCRMGMT) function. We will show how this enhancement improves structure recovery processing when a loss of connectivity to a coupling facility (CF) occurs. Our experiences result from testing CF failures in the IBM Large Configuration System Test for Enterprise (LCST/e) environment which represents one of the most customer-like test environments within IBM.