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IBM Research Alliance Produces Industry’s First 7nm Node Test Chips

  • IBM Research Alliance Produces Industry’s First 7nm Node Test Chips

    IBM Research Alliance Produces Industry’s First 7nm Node Test Chips

    Date added: 09 Jul 2015

    Dr. Michael Liehr (left) of SUNY Polytechnic Institute's Colleges of Nanoscale Science and Engineering and Bala Haran (right) of IBM Research inspect a wafer comprised of 7nm (nanometer) node test chips in a clean room in Albany, NY. IBM Research, working with alliance partners at SUNY Poly CNSE, has produced the semiconductor industry’s first 7nm node test chips with functional transistors. (Darryl Bautista/Feature Photo Service for IBM)