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IBM Marks Nanotechnology Milestone


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IBM scientists, in collaboration with the University of Regensburg in Germany, are the first ever to measure the force it takes to move individual atoms on a surface.  This fundamental measurement provides important information for designing future atomic-scale devices: computer chips, miniaturized storage devices, and more.

Press releases
Date Title
21 Feb 2008 IBM Scientists First To Measure Force Required To Move Individual Atoms

Photos

  • Measuring the force it takes to move a cobalt atom on a crystalline surface

    Measuring the force it takes to move a cobalt atom on a crystalline surface

    Date added: 21 Feb 2008

    Illustration of an Atomic Force Microscope (AFM) tip measuring the force it takes to move a cobalt atom on a crystalline surface. The ability to measure the exact force it takes to move individual atoms is one of the keys to designing and constructing the small structures that will enable future nanotechnologies.

  • Measuring the force it takes to move a cobalt atom on a crystalline surface

    Measuring the force it takes to move a cobalt atom on a crystalline surface

    Date added: 21 Feb 2008

    Illustration of an Atomic Force Microscope (AFM) tip measuring the force it takes to move a cobalt atom on a crystalline surface. The ability to measure the exact force it takes to move individual atoms is one of the keys to designing and constructing the small structures that will enable future nanotechnologies.

  • The tip of the Atomic Force Microscope

    The tip of the Atomic Force Microscope

    Date added: 21 Feb 2008

    The AFM uses a sharp tip mounted on a flexible beam – akin to a tiny diving board – to measure the interaction between the tip and the atoms on a surface. In the present work, the flexible beam was actually a miniature quartz tuning fork of the type commonly found in clocks and wrist watches. When the tip is positioned close to an atom on the surface, the frequency of the tuning fork changes slightly. The frequency change can be analyzed to determine the force exerted on the atom.

  • The miniature tuning fork inside the AFM

    The miniature tuning fork inside the AFM

    Date added: 21 Feb 2008

    The miniature "tuning fork" inside the AFM used in this IBM Research work. The tuning fork measures the interaction between the tip of the microscope and the atoms on a surface; when the tip is positioned close to an atom on the surface, the frequency of the tuning fork changes slightly. The frequency change can be analyzed to determine the force exerted on the atom. Approximate size of the view: 1.7cm(0.7") x 2.5cm (1")).

  • Tuning fork - a closer look

    Tuning fork - a closer look

    Date added: 21 Feb 2008

    An even closer look at the miniature "tuning fork" inside the AFM used in this IBM Research work. The tuning fork measures the interaction between the tip of the microscope and the atoms on a surface; when the tip is positioned close to an atom on the surface, the frequency of the tuning fork changes slightly. The frequency change can be analyzed to determine the force exerted on the atom.


Contact(s) for the Press kit

Jenny Hunter
IBM Media Relations
510-919-5320
jennyh@us.ibm.com