Test C2090-551: IBM Optim Implementation for Distributed Systems (2009)
Note: This test will be withdrawn on Dec 30 2013.
The replacement test is: (000-552) IBM InfoSphere Optim for Distributed Systems - V7.3.1
Two to four years practical Implementation experience and attendance of the following courses:
Study Guide for the certification test.
All Course Formats
Using Optim Data Growth for Archiving on Dist Systems
Course duration: 3 days
Course number: DT205G or 2T205G or 1T205G or 2T204G or 1T204G
This course is designed to provide technical end-users and DBAs with a foundation in the functionality basics of the InfoSphere Optim Data Growth solution. This course focuses on the technical aspects of the Optim solution and is intended for technical audiences. Students will use Optim technology working through hands-on practice on how to apply the technology to business scenarios. This course prepares technical users with the Optim knowledge and skills necessary to participate in an Optim implementation project and confidently perform Optim tasks ongoing.
This course is designed to introduce the attendee to IBM Optim and to Optim's capabilities in helping clients to manage data growth. Students will use Optim processes to archive, delete, browse, restore, load, and insert data. They will also learn to use Open Data Manager (ODM) to access archived files and perform management activities.
This course prepares technical users with the Optim knowledge and skills necessary to participate in an Optim implementation project and confidently perform Optim tasks ongoing. During the course, hands-on exercises will be used to check the attendee's progress.
Course DT204* uses IBM InfoSphere Optim Data Growth Solution V9.1 on distributed systems.
Course DT205* uses IBM InfoSphere Optim Data Growth Solution V220.127.116.11 on distributed systems.
Course duration: 3 days
Course number: DT215G | 2T215G | 1T215G | 2T214G | 1T214G
This course is designed to provide you with a foundation in the functionality basics of the Optim Solution. This course provides a conceptual understanding of test data management and data privacy as well as the Optim Solution's capabilities for speeding application deployment by extracting related subsets of production data to create realistic right-sized databases for development, testing, and QA environments, editing test data, and comparing before-and-after snapshots of data to validate changes and verify application accuracy. This course serves as a foundation for the Optim Solution's features and functionality.
This course focuses on the technical aspects of the Optim Solution and is intended for technical audiences. You will learn the basics of how the technology works through hands-on exercises illustrating how the technology applies to business scenarios. This course does not include information on how to install and configure the technology.
This course prepares technical users with the Optim knowledge and skills necessary to use Optim in ongoing development and testing activities.
This course is for students who have one of the following products:
- IBM InfoSphere Optim Test Data Management Solution - Data Masking Option V18.104.22.168 on distributed systems
- IBM InfoSphere Optim Test Data Management Solution V22.214.171.124 on distributed systems
IBM Optim Core Technology for Distributed Systems
Course duration: 5.0 days
Course number: DT29x
This course replaces Implementing Optim Core Technology Workshop for Distributed Systems (DT291). This is the Classroom version of Instructor-Led Online course IBM Optim Core Technology for Distributed Systems - Instructor Led Online (3T292).
This course combines the material of Optim Data Growth for Distributed Systems (DT201) with Optim Data Privacy for Distributed Systems (DT211), and eliminates any material from DT211 taught on Days 4 and 5 that was already covered in DT201 in Days 1 through 3. Thus, anyone taking just DT201 would leave at the end of Day 3. The optional Unit on Data Security (Unit 28) can be taught after Unit 21 on Day 3, or later in the course in the numerical sequence presented in the materials.
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